Scan-Probe Facility

The instrumention in the Scan-Probe facility offers AFM with AC, Contact modes with 5 channels of imaging outputs, Nanolithography and Nanomanipulation, Conductive AFM (ORCA), MFM, EFM, Coax RF Scanning Probe Microscope.  In addition an array of advanced force measurements, controlled measurement environments: fluid, sample temperature, variable field are supported.  Also enabled is a combination of AFM and fluorescence optical microscope with high speed camera detection.