Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy is one of our core competencies at the Center for Nanoscale Systems. We offer in-depth training, applications support, and analysis services for our TEMs. We offer a state-of-the-art collection of high-resolution, aberration-corrected, and cryogenic TEM platforms. Our aberration-corrected TEMs offer very high resolutions such as 1.36 Angstroms at 40keV, and as small as 80 picometers at 200keV.  Our knowledgeable staff members can guide you through the sample preparation process for electron microscopy and provide expertise in imaging and analysis of your sample.