Scanning Electron Microscopy (SEM)

We offer training and applications support for our scanning electron microscopes: environmental SEMs capable of imaging wet biomaterials, high-resolution field emission SEMs capable of nanometer imaging resolution, and dual-beam FIB-SEMs capable of simultaneous imaging and milling. We can image wet samples, non-conductive materials using variable pressure mode, and conductive samples at the highest resolution using ultra-high vacuum imaging mode. Our sample preparation room hosts ion mills, cross-section polishers, critical point dryers, and other systems to facilitate your image acquisition.


Our SEM training procedure comprises three parts: an online course, a hands-on training and a certification. The online training can be accessed by users with a Harvard Key here (non-Harvard users without a Harvard Key should contact us for assistance). Please contact Tim Cavanaugh for more details on our SEM training program.